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Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

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Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

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Brand Name : WINNER

Certification : ISO9100

Place of Origin : CHINA

MOQ : 3000pcs

Price : 999

Payment Terms : L/C,Western Union,T/T

Supply Ability : 100000 rolls per month

Delivery Time : 5-8 WORKING DAYS

Packaging Details : Neutrial Packing or with OEM LOGO

Product name : spring test probe

Barrel : P.B., Gold-palted

Bottom Plunger : BeCu/SK4,gold -plated

TOP Plunger : SK4(Be Cu)/Gold Plated

Spring : SWPB(SUS)/Gold Plated

Availability : Custom sizes available

Coating : Gold plated

Current Rating : 3A

contact resistance : 50 mohms max

Bandwidth : -0.19dB @ 19.6GHz

inductace : 1.15nH

Captance : 1.41pF

Full stroke : 0.7mm

Rated stroke : 0.5mm

spring force : 25grams@0.5mm

Mechanical Life Exceeds : 200K

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Dual-Head High-Frequency IC Test Probe YOUFU UF-FTO55FD030-002
High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0. Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.
Key Product Features
  • High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
  • Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
  • Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
  • Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory
Product Images
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002





Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002


Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002
Detailed Component Illustration
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002
Comparison of different test probe tip types and configurations
Customization Options
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:
  • Custom diameters to match your specific requirements
  • Custom plating thicknesses for optimal conductivity and durability
  • Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.
Manufacturing Process
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002
Our probe manufacturing facility
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002
Quality control inspection
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002
Packaged probes ready for shipment

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Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 Images

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